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ECCM9 Series Crystal |
Stock Search
Quote/Sample
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- RoHS compliant (Pb-Free)
- Miniature four pad ceramic surface mount package
- AT cut
- Standard frequencies up to 48.000MHz available
- Tape and reel available
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Nominal Frequency |
10.000MHz, 11.0592MHz, 12.000MHz, 12.288MHz, 12.800MHz, 13.000MHz, 13.225MHz, 13.500MHz, 13.560MHz,
13.824MHz, 14.000MHz, 14.318MHz, 14.31818MHz, 14.400MHz, 14.487MHz
14.745MHz, 14.7456MHz, 15.360MHz, 16.000MHz, 16.367MHz, 16.368MHz, 16.384MHz, 16.800MHz,
16.934MHz, 16.9344MHz, 18.432MHz, 19.200MHz, 19.440MHz, 19.500MHz,
19.680MHz, 20.000MHz, 20.480MHz, 21.250MHz, 22.000MHz, 24.000MHz, 24.545MHz,
24.54545MHz, 24.553MHz, 24.576MHz, 25.000MHz, 26.000MHz, 27.000MHz, 28.375MHz, 28.636MHz, 28.6363MHz, 28.63636MHz,
30.000MHz, 30.720MHz, 32.000MHz, 32.110MHz, 33.000MHz, 35.328MHz, 36.000MHz, 38.400MHz, 39.000MHz,
40.000MHz, 44.000MHz, 45.000MHz, 48.000MHz, 50.000MHz and 54.000MHz |
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The specified reference or "center" frequency of the crystal.
Typically specified in megahertz (MHz)or kilohertz (kHz).
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Frequency Tolerance /Stability |
±50ppm at 25°C / ±100ppm Over Operating Temperature Range
±30ppm at 25°C / ±50ppm Over Operating Temperature Range
±15ppm at 25°C / ±30ppm Over Operating Temperature Range
±15ppm at 25°C / ±20ppm Over Operating Temperature Range
±10ppm at 25°C / ±15ppm Over Operating Temperature Range
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The amount of frequency deviation from a specified center frequency
at ambient temperature (referenced at 25°C). This parameter is specified with a
maximum and minimum frequency deviation, expressed in percent (%) or parts per million
(ppm). This deviation is associated with a set of operating conditions including: Load
Capacitance and Drive Level.
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Operating Temperature Range |
0°C to +70°C
-20°C to +70°C
-40°C to +85°C
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The maximum and minimum temperatures that
the crystal device can be exposed to during oscillation.Over this
temperature range,all of the specified device operating
parameters are guaranteed.
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Load Capacitance |
Series Resonant
8pF Parallel Resonant to 50pF Parallel Resonant |
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A crystal can be used in an oscillator circuit to operate in either of two resonant
modes: Series Resonance or Parallel Load Resonance (also known as anti-resonance). The crystals used in
these two types of modes are physically the same crystal, but calibrated to slightly different frequencies.
See the crystal reactance curve for a graphical
presentation of this effect. When a crystal is placed into an oscillator circuit,they oscillate together at a
tuned frequency. This frequency is dependent upon the crystal design and the amount of Load Capacitance,
if any, the oscillator circuit presents to the crystal. Specified in picofarads (pF), Load Capacitance is
comprised of a combination of the circuits discrete load capacitance, stray board capacitance, and capacitance
from semiconductor miller effects. When an oscillator circuit presents some amount of load capacitance to a
crystal, the crystal is termed "Parallel Load Resonant", and a value of Load Capacitance must be
specified. If the circuit does not exhibit any capacitive loading, the crystal is termed "Series
Resonant", and no value of Load Capacitance is specified. The "Parallel Load Resonant"
operating frequency of a quartz crystal is based on this
equation.
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Equivalent Series Resistance (ESR) |
70 Ohms Maximum from 10.000MHz to 14.999MHz
60 Ohms Maximum from 15.000MHz to 19.999MHz
50 Ohms Maximum from 20.000MHz to 34.999MHz
45 Ohms Maximum from 35.000MHz to 54.000MHz
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The resistive element, measured in ohms, of a crystal device. At the frequency found in
Equation 1, the motional inductance
(L1)and motional capacitance (C1) are of equal ohmic value
but are exactly opposite in phase. The net result is that they cancel one another and only
a resistance remains in the series leg of the equivalent circuit. The ESR measurement is made only at the series
resonant frequency (FS), not at some predetermined parallel resonant frequency
(FL). Crystal resistance measured at some parallel load resonant frequency is
often called the "effective" resistance.
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Shunt Capacitance |
7pF Maximum |
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The static capacitance between the crystal
terminals. Measured in picofarads (pF), Shunt Capacitance is present
whether the device is oscillating or not (unrelated to the piezoelectric
effect of the quartz). Shunt Capacitance is derived from the
dielectric of the quartz, the area of the crystal electrodes,
and the capacitance presented by the crystal holder.
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Mode of Operation |
Fundamental AT-Cut |
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The Mode of Operation of a quartz device is one
of the factors that will determine the frequency of oscillation. For
"AT" cut quartz crystals, over tone modes are at odd frequency
harmonics. For example, a crystal may operate at its fundamental frequency
of 10 MHz, or at odd harmonics of approximately 30MHz (Third Overtone), 50MHz
(Fifth Over tone), and 70 MHz (Seventh Overtone).
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Storage Temperature |
-40°C to +125°C |
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The minimum and maximum temperatures that the device can
be stored or exposed to when in a non-oscillation state. After exposing or
storing the device at the minimum or maximum temperatures for a length of
time, all of the operating specifications are guaranteed over the specified
Operating Temperature Range.
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Drive Level |
100 µWatts Maximum, 10 µWatts Correlation |
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A function of the driving or excitation current flowing
through the crystal. The Drive Level is the amount of power dissipation in
the crystal, expressed in microwatts or milliwatts. Maximum power is the most
power the device can dissipate while still maintaining operation with all
electrical parameters guaranteed. Drive level should be maintained at the
minimum levels necessary to initiate proper start-up and assure steady state
oscillation. Excessive drive level can cause poor aging characteristics and
crystal damage.
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Aging (at 25°C) |
±3ppm/year Maximum |
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The systematic change in frequency with time due to internal changes in the crystal. Aging
is often expressed as a maximum value in parts per million per year [ppm/yr]. The rate of
aging is typically greatest during the first 30 to 60 days after which time the aging rate
decreases. The following factors effect crystal aging: adsorption and desorption of
contamination on the surfaces of the quartz, stress relief of the mounting and bonding
structures, material outgassing, and seal integrity.
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| Insulation Resistance |
500 Megaohms Minimum at 100VDC |
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| Spurious Response |
-3dB Minimum from FO to FO+5000ppm |
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| All dimensions in millimeters |
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| Please note that this form is intended to provide a listing
of standard options. If you require an option or configuration
that is not present here, you may want to fill out our
Custom Crystal Part Number Request Form. If you have any trouble with
this form, or just have a suggestion as to how it might be improved, please
contact our Webmaster. |
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| Line 1: |
EXX.XX
- E = Ecliptek
- XX.XX = Nominal Frequency in Megahertz (4 Digits Maximum + Decimal)
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| Line 2: |
XXXXX
- XXXXX = Ecliptek Manufacturing Identifier
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| ESD Susceptibility: |
MIL-STD-883, Method 3015, Class 1, HBM: 1500V |
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| Fine Leak Test: |
MIL-STD-883, Method 1014, Condition A |
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| Flammability: |
UL94-V0 |
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| Gross Leak Test: |
MIL-STD-883, Method 1014, Condition C |
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| Mechanical Shock: |
MIL-STD-883, Method 2002, Condition B |
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| Moisture Resistance: |
MIL-STD-883, Method 1004 |
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| Moisture Sensitivity: |
J-STD-020, MSL 1 |
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| Resistance to Soldering Heat: |
MIL-STD-202, Method 210, Condition K |
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| Resistance to Solvents: |
MIL-STD-202, Method 215 |
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| Solderability: |
MIL-STD-883, Method 2003 |
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| Temperature Cycling: |
MIL-STD-883, Method 1010, Condition B |
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| Vibration: |
MIL-STD-883, Method 2007, Condition A |
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Mechanical Dimensions
Part Number Constructor / Request a Quote or Sample
Marking Specifications
Environmental & Mechanical Specifications
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