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EB52F4 Series Test Circuits
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- Note 1: An external 0.1µF low frequency tantalum bypass capacitor
in parallel with a 0.01µF high frequency ceramic bypass capacitor close to
the package ground and pin is required.
- Note 2: A low input capacitance (<12pF), 10X Attentuation Factor, High
Impedance (>10Mohms), and High bandwidth (>300MHz) passive probe is recommended.
- Note 3: Capacitance value includes sum of all probe and fixture capacitance.
See applicable specification sheet for ‘Load Drive Capability’.
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- Note 1: An external 0.1µF low frequency tantalum bypass capacitor
in parallel with a 0.01µF high frequency ceramic bypass capacitor close to
the package ground and pin is required.
- Note 2: A low input capacitance (<12pF), 10X Attentuation Factor, High
Impedance (>10Mohms), and High bandwidth (>300MHz) passive probe is recommended.
- Note 3: Capacitance value includes sum of all probe and fixture capacitance.
See applicable specification sheet for ‘Load Drive Capability’.
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Test Circuit with No Connect Option