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EC26 Series Oscillator |
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Quote/Sample
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- Crystal Clock Oscillators
- LVCMOS Output
- +3.3V Supply Voltage
- Tri-State Output Function
- 4 Pad Ceramic SMD Package
- Low Stand-by Current
- RoHS Compliant (Pb-Free)
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Nominal Frequency |
From 1.544MHz to 125.000MHz
and 125.00093MHz, 125.00312MHz, 125.009MHz, 125.00937MHz, 125.010MHz, 126.000MHz, 127.000MHz, 128.000MHz, 130.000MHz,
131.000MHz, 131.072MHz, 131.250MHz, 132.000MHz, 133.000MHz, 133.330MHz, 133.333MHz, 133.3333MHz, 135.000MHz,
136.000MHz, 137.472MHz, 140.000MHz, 142.000MHz, 142.850MHz, 143.000MHz, 145.000MHz, 148.351MHz, 148.3516MHz,
148.5000MHz, 150.000MHz, 155.000MHz, 155.520MHz, 156.250MHz, 159.375MHz, 159.380MHz, 161.1328MHz, 162.500MHz, 166.000MHz,
175.000MHz, 187.500MHz, or 200.000MHz
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The specified reference or "center" frequency of the oscillator.
Typically specified in megahertz (MHz)or kilohertz (kHz).
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Frequency Tolerance/Stability |
(Inclusive of all conditions: Calibration Tolerance at 25°C, Frequency Stability over the Operating Temperature Range,
Supply Voltage Change, Output Load Change, First Year Aging at 25°C, Shock and Vibration)
±100ppm Maximum
±50ppm Maximum
±25ppm Maximum
±20ppm Maximum |
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This "inclusive" specification is the amount of frequency deviation
from the center frequency associated with a set of operating
conditions. These conditions include: Operating Temperature Range,
Supply Voltage, and Output Load. This parameter is specified with a
maximum and minimum frequency deviation, expressed in percent (%)
or parts per million (ppm).
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Operating Temperature Range |
-10°C to +70°C
-40°C to +85°C |
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The maximum and minimum temperatures that
the oscillator device can be exposed to during oscillation. Over this
temperature range, all of the specified device operating
parameters are guaranteed.
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Supply Voltage (VDD) |
3.3VDC ±10% |
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The DC input voltage necessary for oscillator operation, specified in
volts.
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Input Current |
10mA Maximum from 1.544MHz to 32.000MHz
18mA Maximum from 32.000001MHz to 50.000MHz
20mA Maximum from 50.000001MHz to 70.000MHz
40mA Maximum from 70.000001MHz to 125.000MHz
60mA Maximum from 125.000001MHz to 200.000MHz |
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The amount of current consumption by an oscillator from the power
supply, typically specified in milliamps (mA).
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Output Voltage Logic High (VOH) |
90% of VDD Minimum (IOH= -8mA) |
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Defined as the Output Voltage Logic High or "Logic 1"
(Figure 1 in oscillator
glossary of terms).
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Output Voltage Logic Low (VOL) |
10% of VDD Maximum (IOL= +8mA) |
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Defined as the Output Voltage Logic Low or "Logic 0"
(Figure 1 in oscillator
glossary of terms).
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Duty Cycle |
Measured at 50% of waveform
50 ±10(%)
50 ±5(%)
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The measure of output waveform uniformity. This term, also referred
to as symmetry, is a measurement of the time that the output
waveform is in a logic high state, expressed as a percentage (%).
This parameter is measured at a specified voltage threshold or at a
percentage of the output waveform amplitude (Figure 1 in the oscillator glossary of terms).
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Rise Time/Fall Time |
Measured at 20% to 80% of Waveform
7nSec Maximum with 30pF Load over Nominal Frequency 1.544MHz to 35.000MHz
5nSec Maximum with 15pF Load over Nominal Frequency 1.544MHz to 35.000MHz
3nSec Maximum with 15pF Load over Nominal Frequency 35.000001MHz to 165.000MHz
2nSec Maximum with 15pf Load over Nominal Frequency 165.000001MHz to 200.000MHz |
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The Rise Time, measured in nanoseconds (nSec), is defined as the
transition time from an output logic low to an output logic high.
Conversely, the Fall Time, also measured in nanoseconds (nSec), is
defined as the transition time from an output logic high to an output
logic low. This transition time is measured at specified voltage
thresholds or at specified percentages of the output waveform
amplitude
(Figure 1 in the oscillator glossary of terms).
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Load Drive Capability |
30pF Maximum from 1.544MHz to 35.000MHz
15pF Maximum from 35.000001MHz to 200.000MHz |
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The maximum load the oscillator can drive specified in terms of the
number of gates or the type of load circuit (Figures 2, 3 and 4 in oscillator glossary of terms).
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Storage Temperature |
-55°C to +125°C |
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The minimum and maximum temperatures that the device can
be stored or exposed to when in a non-oscillation state. After exposing or
storing the device at the minimum or maximum temperatures for a length of
time, all of the operating specifications are guaranteed over the specified
Operating Temperature Range.
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| Output Control Function |
Tri-State Enable High |
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| Tri-State Input Voltage |
+0.7VDD Min. or No Connect to Enable Output. +0.3VDD Max. to Disable Output. |
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| RMS Phase Jitter |
1pSec Maximum (12kHz to 20MHz offset frequency) |
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Start Up Time |
10mSec Maximum |
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The specified time from oscillator power-up to the time the oscillator
reaches steady state oscillation.
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| Standby Current |
10µA Maximum (Disabled Output, High Impedance) |
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| All Dimensions in Millimeters |
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| Pin 1: Tri-State |
Pin 3: Output |
| Pin 2: Case Ground |
Pin 4: Supply Voltage |
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| Please note that this form is intended to provide a listing
of standard options. If you require an option or configuration
that is not present here, you may want to fill out our
Custom Oscillator Part Number Request Form. If you have any trouble with
this form, or just have a suggestion as to how it might be improved, please
contact our Webmaster. |
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| Line 1: |
ECLIPTEK |
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| Line 2: |
XX.XXX M
- XX.XXX = Frequency (5 Digits Maximum + Decimal)
- M = Frequency unit of measure(MHz)
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| Line 3: |
XX Y ZZ
- XX = Ecliptek Manufacturing Identifier
- Y = Last digit of Year
- ZZ = Week of Year
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| ESD Susceptibility: |
MIL-STD-883, Method 3015, Class 1, HBM:1500V |
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| Fine Leak Test: |
MIL-STD-883, Method 1014, Condition A |
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| Flammability: |
UL94-V0 |
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| Gross Leak Test: |
MIL-STD-883, Method 1014, Condition C |
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| Mechanical Shock: |
MIL-STD-883, Method 2002, Condition B |
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| Moisutre Resistance: |
MIL-STD-883, Method 1004 |
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| Moisture Sensitivity: |
J-STD-020, MSL 1 |
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| Resistance to Soldering Heat: |
MIL-STD-202, Method 210, Condition K |
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| Resistance to Solvents: |
MIL-STD-202, Method 215 |
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| Solderability: |
MIL-STD-883, Method 2003 |
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| Temperature Cycling: |
MIL-STD-883, Method 1010, Condition B |
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| Vibration: |
MIL-STD-883, Method 2007, Condition A |
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