EC31 Series Test Circuits

TTL Test Circuit

Test Circuit Schematic
  • Note 1: An external 0.1µF low frequency tantalum bypass capacitor in parallel with a 0.01µF high frequency ceramic bypass capacitor close to the package ground and VDD pin is required.
  • Note 2: A low input capacitance (<12pF), 10X Attentuation Factor, High Impedance (>10Mohms), and High bandwidth (>300MHz) passive probe is recommended.
  • Note 3: Capacitance value CL includes sum of all probe and fixture capacitance.
  • Note 4: Resistance value RL is shown in Table I. See applicable specification sheet for ‘Load Drive Capability’.
  • Note 5: All diodes are MMBD7000, MMBD914, or equivalent.

Table 1: RL Resistance Value and CL Capacitance Value Vs. Output Load Drive Capability
Output Load
Drive Capability
RL Value
(Ohms)
CL Value
(pF)
10TTL 390 15
5TTL 780 15
2TTL 1100 6
10LSTTL 2000 15
1TTL 2200 3

Top of Page

CMOS Test Circuit

Test Circuit Schematic
  • Note 1: An external 0.1µF low frequency tantalum bypass capacitor in parallel with a 0.01µF high frequency ceramic bypass capacitor close to the package ground and pin is required.
  • Note 2: A low input capacitance (<12pF), 10X Attentuation Factor, High Impedance (>10Mohms), and High bandwidth (>300MHz) passive probe is recommended.
  • Note 3: Capacitance value includes sum of all probe and fixture capacitance. See applicable specification sheet for ‘Load Drive Capability’.
Top of Page
Category
Oscillator
Series
EC31
Package
14 pin DIP
8 pin DIP
Voltage
5.0V
Class
OS13
OS18
Revision
Q 08-18-2006
H 08-18-2006
[ All Content Copyright © 2008 Ecliptek Corporation | Legal Disclaimer| Privacy Policy ]