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Nominal Frequency |
1.544MHz to 44.736MHz |
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The specified reference or "center" frequency of the oscillator.
Typically specified in megahertz (MHz)or kilohertz (kHz).
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| Frequency Stability |
|
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Operating Temperature Range |
per Operating Temperature Ranges vs. Frequency Stabilities table below |
|
The maximum and minimum temperatures that
the oscillator device can be exposed to during oscillation. Over this
temperature range, all of the specified device operating
parameters are guaranteed.
|
|
Supply Voltage (VDD) |
5.0VDC ±5% |
|
The DC input voltage necessary for oscillator operation, specified in
volts.
|
|
Input Current |
20mA Maximum |
|
The amount of current consumption by an oscillator from the power
supply, typically specified in milliamps (mA).
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Output Voltage Logic High (VOH) |
2.4VDC Minimum with TTL Load
VDD-0.5VDC Minimum with HCMOS Load |
|
Defined as the Output Voltage Logic High or "Logic 1"
(Figure 1 in oscillator
glossary of terms).
|
|
Output Voltage Logic Low (VOL) |
0.4VDC Maximum with TTL load
0.5VDC Maximum with HCMOS load |
|
Defined as the Output Voltage Logic Low or "Logic 0"
(Figure 1 in oscillator
glossary of terms).
|
|
Duty Cycle |
50 ±10(%) measured at 1.4VDC with TTL load or 50% of waveform with HCMOS load |
|
The measure of output waveform uniformity. This term, also referred
to as symmetry, is a measurement of the time that the output
waveform is in a logic high state, expressed as a percentage (%).
This parameter is measured at a specified voltage threshold or at a
percentage of the output waveform amplitude (Figure 1 in the oscillator glossary of terms).
|
|
Rise Time/Fall Time |
10nSec Maximum measured over 0.4VDC to 2.4VDC with TTL load or from 20% to 80%
of waveform with HCMOS load. |
|
The Rise Time, measured in nanoseconds (nSec), is defined as the
transition time from an output logic low to an output logic high.
Conversely, the Fall Time, also measured in nanoseconds (nSec), is
defined as the transition time from an output logic high to an output
logic low. This transition time is measured at specified voltage
thresholds or at specified percentages of the output waveform
amplitude
(Figure 1 in the oscillator glossary of terms).
|
|
Load Drive Capability |
10 TTL or 15pF HCMOS Load Maximum |
|
The maximum load the oscillator can drive specified in terms of the
number of gates or the type of load circuit (Figures 2, 3 and 4 in oscillator glossary of terms).
|
|
Aging (at 25°C) |
±1ppm/year Maximum |
|
The systematic change in frequency with time due to internal changes in the crystal. Aging
is often expressed as a maximum value in parts per million per year (ppm/yr). The rate of
aging is typically greatest during the first 30 to 60 days after which time the aging rate
decreases. The following factors effect crystal aging: adsorption and desorption of
contamination on the surfaces of the quartz, stress relief of the mounting and bonding
structures, material outgassing, and seal integrity.
|
|
Storage Temperature |
-40°C to +85°C |
|
The minimum and maximum temperatures that the device can
be stored or exposed to when in a non-oscillation state. After exposing or
storing the device at the minimum or maximum temperatures for a length of
time, all of the operating specifications are guaranteed over the specified
Operating Temperature Range.
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| Control Voltage (External) |
2.5VDC ±2.0VDC, Positive Transfer Characteristic.
|
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| Frequency Deviation |
±7ppm Minimum, ±20ppm Maximum over Control Voltage (VC)
Referenced to F0 at VC=2.5VDC; VDD=5.0VDC
|
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| Internal Trim (Top of Can) |
±3ppm Minimum |
|
| Typical Phase Noise |
-70dBc/Hz at 10Hz offset
-100dBc/Hz at 100Hz offset
-130dBc/Hz at 1kHz offset
-140dBc/Hz at 10kHz offset
-145dBc/Hz at 100kHz offset
|
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| Input Impedance |
10kOhms Typical |
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| Modulation Bandwidth |
10kHz Minimum measured at -3dB, VC=2.5VDC |
|
Check Stock
Operating Temperature Ranges vs. Frequency Stabilities
Mechanical Dimensions
Part Number Constructor / Request a Quote or Sample
Marking Specifications
Environmental & Mechanical Specifications
Other Resources