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EH56 Series Oscillator |
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Quote/Sample
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- Crystal Clock Oscillators
- LVCMOS Output
- +3.3V Supply Voltage
- Tri-State Output Function
- 4 Pad Ceramic SMD Package
- Low Stand-by Current
- RoHS Compliant (Pb-Free)
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Nominal Frequency |
3.300MHz, 3.6864MHz, 5.000MHz, 6.000MHz, 6.144MHz, 7.000MHz, 8.000MHz, 9.000MHz, 10.000MHz, 12.000MHz,
14.7456MHz, 16.000MHz, 19.200MHz, 20.000MHz, 24.000MHz, 25.000MHz, 26.000MHz, 27.000MHz, 30.000MHz, 32.000MHz, 33.000MHz,
33.330MHz, 33.333MHz, 37.500MHz, 40.000MHz, 48.000MHz, 50.000MHz, 52.000MHz, 54.000MHz, 55.000MHz, 66.000MHz,
70.000MHz, 75.000MHz, 80.000MHz, 83.000MHz, 88.000MHz, 96.000MHz or 100.000MHz |
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The specified reference or "center" frequency of the oscillator.
Typically specified in megahertz (MHz)or kilohertz (kHz).
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Frequency Tolerance/Stability |
(Inclusive of all conditions: Calibration Tolerance at 25°C, Frequency Stability over the Operating Temp. Range,
Supply Voltage Change, Output Load Change, First Year Aging @25°C, Shock, and Vibration)
±100ppm Maximum
±50ppm Maximum
±25ppm Maximum
±20ppm Maximum |
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This "inclusive" specification is the amount of frequency deviation
from the center frequency associated with a set of operating
conditions. These conditions include: Operating Temperature Range,
Supply Voltage, and Output Load. This parameter is specified with a
maximum and minimum frequency deviation, expressed in percent (%)
or parts per million (ppm).
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Operating Temperature Range |
0°C to +70°C
-40°C to +85°C |
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The maximum and minimum temperatures that
the oscillator device can be exposed to during oscillation. Over this
temperature range, all of the specified device operating
parameters are guaranteed.
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Supply Voltage (VDD) |
3.3VDC ±5% |
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The DC input voltage necessary for oscillator operation, specified in
volts.
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Input Current (No Load) |
10mA Maximum over Nominal Frequency of 3.300MHz to 25.000MHz
12mA Maximum over Nominal Frequency of 25.000001MHz to 50.000MHz
13mA Maximum over Nominal Frequency of 50.000001MHz to 100.000MHz
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The amount of current consumption by an oscillator from the power
supply, typically specified in milliamps (mA).
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Output Voltage Logic High (VOH) |
90% of VDD Minimum (IOH=-8mA) |
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Defined as the Output Voltage Logic High or "Logic 1"
(Figure 1 in oscillator
glossary of terms).
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Output Voltage Logic Low (VOL) |
10% of VDD Maximum (IOL=+8mA) |
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Defined as the Output Voltage Logic Low or "Logic 0"
(Figure 1 in oscillator
glossary of terms).
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Duty Cycle |
Measured at 50% of waveform.
50 ±10(%)
50 ±5(%) |
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The measure of output waveform uniformity. This term, also referred
to as symmetry, is a measurement of the time that the output
waveform is in a logic high state, expressed as a percentage (%).
This parameter is measured at a specified voltage threshold or at a
percentage of the output waveform amplitude (Figure 1 in the oscillator glossary of terms).
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Rise Time/Fall Time |
Measured from 20% to 80% of waveform.
6nSec Maximum from 3.300MHz to 50.000MHz
4nSec Maximum from 50.000001MHz to 75.000MHz
2nSec Maximum from 75.000001MHz to 100.000MHz |
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The Rise Time, measured in nanoseconds (nSec), is defined as the
transition time from an output logic low to an output logic high.
Conversely, the Fall Time, also measured in nanoseconds (nSec), is
defined as the transition time from an output logic high to an output
logic low. This transition time is measured at specified voltage
thresholds or at specified percentages of the output waveform
amplitude
(Figure 1 in the oscillator glossary of terms).
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Load Drive Capability |
30pF HCMOS Load Maximum from 3.300MHz to 50.000MHz
15pF HCMOS Load Maximum from 50.000001MHz to 100.000MHz |
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The maximum load the oscillator can drive specified in terms of the
number of gates or the type of load circuit (Figures 2, 3 and 4 in oscillator glossary of terms).
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Aging (at 25°C) |
±5ppm/year Maximum |
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The systematic change in frequency with time due to internal changes in the crystal. Aging
is often expressed as a maximum value in parts per million per year (ppm/yr). The rate of
aging is typically greatest during the first 30 to 60 days after which time the aging rate
decreases. The following factors effect crystal aging: adsorption and desorption of
contamination on the surfaces of the quartz, stress relief of the mounting and bonding
structures, material outgassing, and seal integrity.
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Storage Temperature |
-55°C to +125°C |
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The minimum and maximum temperatures that the device can
be stored or exposed to when in a non-oscillation state. After exposing or
storing the device at the minimum or maximum temperatures for a length of
time, all of the operating specifications are guaranteed over the specified
Operating Temperature Range.
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| Output Control Function |
Tri-State Enable High |
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| Tri State Input Voltage |
90% of VDD Minimum or No Connection to enable output.
10% of VDD Maximum disable output(High Impedance). |
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| Standby Current |
10µA Maximum (Pin 1 = Ground) |
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| Jitter |
Absolute: ±100pSec Maximum |
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Start Up Time |
10mSec Maximum |
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The specified time from oscillator power-up to the time the oscillator
reaches steady state oscillation.
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| All Dimensions in Millimeters |
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| Pin 1: Tri-State |
Pin 3: Output |
| Pin 2: Case Ground |
Pin 4: Supply Voltage |
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| Please note that this form is intended to provide a listing
of standard options. If you require an option or configuration
that is not present here, you may want to fill out our
Custom Oscillator Part Number Request Form. If you have any trouble with
this form, or just have a suggestion as to how it might be improved, please
contact our Webmaster. |
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| Line 1: |
EPO |
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| Line 2: |
XXXXX
- XXXXX = Ecliptek Manufacturing Code
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| ESD Susceptibility: |
MIL-STD-883, Method 3015, Class 1, HBM:1500V |
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| Fine Leak Test: |
MIL-STD-883, Method 1014, Condition A |
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| Flammability: |
UL94-V0 |
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| Gross Leak Test: |
MIL-STD-883, Method 1014, Condition C |
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| Mechanical Shock: |
MIL-STD-883, Method 2002, Condition B |
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| Moisutre Resistance: |
MIL-STD-883, Method 1004 |
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| Moisture Sensitivity: |
J-STD-020, MSL 1 |
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| Resistance to Soldering Heat: |
MIL-STD-202, Method 210, Condition K |
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| Resistance to Solvents: |
MIL-STD-202, Method 215 |
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| Solderability: |
MIL-STD-883, Method 2003 |
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| Temperature Cycling: |
MIL-STD-883, Method 1010, Condition B |
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| Vibration: |
MIL-STD-883, Method 2007, Condition A |
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Mechanical Dimensions
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