 |
Nominal Frequency
Some frequencies within this range may not be available. |
1.000MHz to 220.000MHz |
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The specified reference or "center" frequency of the oscillator.
Typically specified in megahertz (MHz)or kilohertz (kHz).
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Frequency Tolerance/Stability
Some Tolerance/Stability options may not be available. |
(Inclusive of all conditions: Calibration Tolerance at 25°C, Frequency Stability over the Operating Temperature Range,
Supply Voltage Change, Output Load Change, First Year Aging at 25°C, 260° Reflow, Shock and Vibration)
±100ppm Maximum
±50ppm Maximum
±25ppm Maximum
±20ppm Maximum |
|
This "inclusive" specification is the amount of frequency deviation
from the center frequency associated with a set of operating
conditions. These conditions include: Operating Temperature Range,
Supply Voltage, and Output Load. This parameter is specified with a
maximum and minimum frequency deviation, expressed in percent (%)
or parts per million (ppm).
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|
Operating Temperature Range |
0°C to +70°C
-20°C to +70°C
-40°C to +85°C |
|
The maximum and minimum temperatures that
the oscillator device can be exposed to during oscillation. Over this
temperature range, all of the specified device operating
parameters are guaranteed.
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|
Supply Voltage (VDD) |
3.3VDC ±0.3VDC |
|
The DC input voltage necessary for oscillator operation, specified in
volts.
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|
Input Current |
Excluding Load Termination Current
80mA Maximum |
|
The amount of current consumption by an oscillator from the power
supply, typically specified in milliamps (mA).
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Output Voltage Logic High (VOH) |
1.425VDC Typical |
|
Defined as the Output Voltage Logic High or "Logic 1"
(Figure 1 in oscillator
glossary of terms).
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|
Output Voltage Logic Low (VOL) |
1.075VDC Typical |
|
Defined as the Output Voltage Logic Low or "Logic 0"
(Figure 1 in oscillator
glossary of terms).
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|
| Differential Output Voltage (VOD) |
247mVDC Minimum, 350mVDC Typical, 454mVDC Maximum |
|
| Offset Voltage (VOS) |
1.125V Minimum, 1.250V Typical, 1.375V Maximum |
|
Duty Cycle |
50 ±5(%) Measured at 50% of waveform |
|
The measure of output waveform uniformity. This term, also referred
to as symmetry, is a measurement of the time that the output
waveform is in a logic high state, expressed as a percentage (%).
This parameter is measured at a specified voltage threshold or at a
percentage of the output waveform amplitude (Figure 1 in the oscillator glossary of terms).
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|
Rise Time/Fall Time |
Measured from 20% to 80% of waveform
225pSec Typical, 325pSec Maximum |
|
The Rise Time, measured in nanoseconds (nSec), is defined as the
transition time from an output logic low to an output logic high.
Conversely, the Fall Time, also measured in nanoseconds (nSec), is
defined as the transition time from an output logic high to an output
logic low. This transition time is measured at specified voltage
thresholds or at specified percentages of the output waveform
amplitude
(Figure 1 in the oscillator glossary of terms).
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|
| Differential Output Error (DVOD) |
50mVDC Maximum |
|
| Offset Error (DVOS) |
50mVDC Maximum |
|
Load Drive Capability |
100 Ohms Between Output and Complementary Output |
|
The maximum load the oscillator can drive specified in terms of the
number of gates or the type of load circuit (Figures 2, 3 and 4 in oscillator glossary of terms).
|
|
Storage Temperature |
-55°C to +125°C |
|
The minimum and maximum temperatures that the device can
be stored or exposed to when in a non-oscillation state. After exposing or
storing the device at the minimum or maximum temperatures for a length of
time, all of the operating specifications are guaranteed over the specified
Operating Temperature Range.
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|
| Output Logic Type |
LVDS |
|
| Logic Control/Additional Output |
Output Enable (OE) and Complementary Output
Standby (ST) and Complementary Output |
|
| Output Control Input Voltage |
VIH of 70% of VCC Minimum Enables Output and Complementary Output
No Connection Enables Output and Complementary Output
VIL of 30% of VCC Maximum Disables Output and Complementary Output: High Impedance |
|
| Output Enable Current |
75mA Maximum (OE) Without Load |
|
| Standby Current |
30µA Maximum (ST) Without Load |
|
| Period Jitter (Deterministic) |
0.2pSec Typical |
|
| Period Jitter (Random) |
2.0pSec Typical |
|
| Period Jitter (RMS) |
1.8pSec Typical, 2.5pSec Maximum |
|
| Period Jitter (pk-pk) |
25pSec Typical, 30pSec Maximum |
|
| RMS Phase Jitter (Fj= 637kHz to 10MHz; Random) |
2.1pSec Typical over Nominal Frequency of 1.000MHz to 100.000MHz
1.7pSec Typical over Nominal Frequency of 100.000001MHz to 156.250MHz
1.6pSec Typical over Nominal Frequency of 156.250001MHz to 220.000MHz |
|
| RMS Phase Jitter (Fj= 1MHz to 20MHz; Random) |
1.7pSec Typical over Nominal Frequency of 1.000MHz to 100.000MHz
1.2pSec Typical over Nominal Frequency of 100.000001MHz to 156.250MHz
0.7pSec Typical over Nominal Frequency of 156.250001MHz to 220.000MHz |
|
| RMS Phase Jitter (Fj= 1.875MHz to 20MHz; Random) |
1.5pSec Typical over Nominal Frequency of 1.000MHz to 100.000MHz
0.7pSec Typical over Nominal Frequency of 100.000001MHz to 156.250MHz
0.6pSec Typical over Nominal Frequency of 156.250001MHz to 220.000MHz |
|
Aging (at 25°C) |
±1ppm Maximum First Year |
|
The systematic change in frequency with time due to internal changes in the crystal. Aging
is often expressed as a maximum value in parts per million per year (ppm/yr). The rate of
aging is typically greatest during the first 30 to 60 days after which time the aging rate
decreases. The following factors effect crystal aging: adsorption and desorption of
contamination on the surfaces of the quartz, stress relief of the mounting and bonding
structures, material outgassing, and seal integrity.
|
|
Start Up Time |
10mSec Maximum |
|
The specified time from oscillator power-up to the time the oscillator
reaches steady state oscillation.
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