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Nominal Frequency (F0) |
1.544MHz, 2.000MHz, 2.048MHz, 3.088MHz, 3.580MHz, 3.686MHz, 4.000MHz, 4.032MHz, 4.096MHz, 4.434MHz,
5.000MHz, 6.144MHz, 6.176MHz, 6.312MHz, 6.400MHz, 8.000MHz, 8.192MHz, 8.448MHz, 10.000MHz, 12.000MHz,
12.288MHz, 12.352MHz, 12.960MHz, 13.000MHz, 13.500MHz, 14.318MHz, 15.360MHz, 15.440MHz, 16.000MHz, 16.384MHz,
16.660MHz, 17.664MHz, 18.432MHz, 19.200MHz, 19.440MHz, 20.000MHz, 20.480MHz, 24.000MHz, 24.576MHz, 24.704MHz, 25.920MHz,
26.000MHz, 27.000MHz, 28.636MHz, 30.000MHz, 30.720MHz, 32.000MHz, 32.768MHz, 34.368MHz, 35.328MHz, 36.864MHz,
38.880MHz, 40.000MHz, 40.960MHz, 44.736MHz, 50.000MHz, 51.840MHz, 52.000MHz, 62.208MHz, 65.536MHz, 74.250MHz,
or 77.760MHz |
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The specified reference or "center" frequency of the oscillator.
Typically specified in megahertz (MHz)or kilohertz (kHz).
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Frequency Tolerance/Stability |
±50ppm Maximum (Inclusive of all conditions: Calibration Tolerance at 25°C,
Frequency Stability over the Operating Temperature Range, Supply Voltage Change,
Output Load Change, Shock, and Vibration) |
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This "inclusive" specification is the amount of frequency deviation
from the center frequency associated with a set of operating
conditions. These conditions include: Operating Temperature Range,
Supply Voltage, and Output Load. This parameter is specified with a
maximum and minimum frequency deviation, expressed in percent (%)
or parts per million (ppm).
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Operating Temperature Range (OTR) |
0°C to +70°C (Standard)
-40°C to +85°C (Optional) |
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The maximum and minimum temperatures that
the oscillator device can be exposed to during oscillation. Over this
temperature range, all of the specified device operating
parameters are guaranteed.
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Supply Voltage (VDD) |
3.3VDC ±10% |
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The DC input voltage necessary for oscillator operation, specified in
volts.
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Input Current (IDD) |
15mA Maximum |
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The amount of current consumption by an oscillator from the power
supply, typically specified in milliamps (mA).
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Output Voltage Logic High (VOH) |
90% of VDD Minimum (IOH = -4mA) |
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Defined as the Output Voltage Logic High or "Logic 1"
(Figure 1 in oscillator
glossary of terms).
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Output Voltage Logic Low (VOL) |
10% of VDD Maximum (IOL = +4mA) |
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Defined as the Output Voltage Logic Low or "Logic 0"
(Figure 1 in oscillator
glossary of terms).
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Duty Cycle (SYM) |
Measured at 50% of waveform.
50 ±10(%) (Maximum)
50 ±5(%) (Typical) |
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The measure of output waveform uniformity. This term, also referred
to as symmetry, is a measurement of the time that the output
waveform is in a logic high state, expressed as a percentage (%).
This parameter is measured at a specified voltage threshold or at a
percentage of the output waveform amplitude (Figure 1 in the oscillator glossary of terms).
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Rise Time/Fall Time (TR/TF) |
5nSec Maximum Measured over 20% to 80% of waveform. |
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The Rise Time, measured in nanoseconds (nSec), is defined as the
transition time from an output logic low to an output logic high.
Conversely, the Fall Time, also measured in nanoseconds (nSec), is
defined as the transition time from an output logic high to an output
logic low. This transition time is measured at specified voltage
thresholds or at specified percentages of the output waveform
amplitude
(Figure 1 in the oscillator glossary of terms).
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Load Drive Capability (CLOAD) |
10TTL Load or 30pF HCMOS Load Maximum <12.288MHz, 15pF HCMOS Load
Maximum >12.288MHz |
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The maximum load the oscillator can drive specified in terms of the
number of gates or the type of load circuit (Figures 2, 3 and 4 in oscillator glossary of terms).
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Aging (at 25°C) |
±2ppm/1st year Typical
±10ppm/10 years Maximum |
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The systematic change in frequency with time due to internal changes in the crystal. Aging
is often expressed as a maximum value in parts per million per year (ppm/yr). The rate of
aging is typically greatest during the first 30 to 60 days after which time the aging rate
decreases. The following factors effect crystal aging: adsorption and desorption of
contamination on the surfaces of the quartz, stress relief of the mounting and bonding
structures, material outgassing, and seal integrity.
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Storage Temperature Range (STR) |
-55°C to +125°C |
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The minimum and maximum temperatures that the device can
be stored or exposed to when in a non-oscillation state. After exposing or
storing the device at the minimum or maximum temperatures for a length of
time, all of the operating specifications are guaranteed over the specified
Operating Temperature Range.
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Start Up Time (TS) |
10mSec Maximum |
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The specified time from oscillator power-up to the time the oscillator
reaches steady state oscillation.
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| Absolute Pull Range (APR) |
Inclusive of all conditions: Calibration Tolerance at 25°C, Frequency Stability
over the Operating Temperature Range, Supply Voltage Change, Output Load Change, Shock,
Vibration, and Aging over Control Voltage (VC)
±50ppm Minimum
±80ppm Minimum (<51.840MHz Only)
±100ppm Minimum (<36.000MHz Only)
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| Linearity |
20% Maximum
10% Typical
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| Control Voltage (VCR) |
0.0VDC to VDD
Please Note: Absoltue Pull Range is tested and guaranteed over Control
Voltage (VC) range of +0.3VDC to +3.0VDC.
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| Transfer function |
Positive Transfer Characteristic |
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| Input Impedance (ZI) |
50kOhms Minimum |
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| Input Leakage Current |
10µA Maximum |
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| Modulation Bandwidth (MBW) |
10kHz Minimum measured at -3dB with a control voltage of 1.65VDC |
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| Typical Phase Noise |
(Measured at FO of 27.000MHz)
-70dBc/Hz at offset of 10Hz
-100dBc/Hz at offset of 100Hz
-130dBc/Hz at offset of 1kHz
-147dBc/Hz at offset of 10kHz
-152dBc/Hz at offset of 100kHz
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| Tri-State Input Voltage |
VIH: No Connection Enables Output
VIH: >0.9VDD Enables Output
VIL: <0.1VDD Disables Output: High Impedance |
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| RMS Phase Jitter |
1pSec Maximum FJ=12kHz to 20MHz |
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