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EV34C3 Series VCXO |
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Quote/Sample
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- Voltage Controlled Crystal Oscillators (VCXO)
- LVCMOS Output
- +2.5V Supply Voltage
- Tri-State Ouput Function (Pad 5)
- External Voltage Control Function
- 6 Pad Ceramic SMD Package
- RoHS Compliant (Pb-Free)
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Nominal Frequency (F0) |
1.544MHz, 2.000MHz, 2.048MHz, 3.088MHz, 3.580MHz, 3.686MHz, 4.000MHz, 4.032MHz, 4.096MHz, 4.434MHz,
5.000MHz, 6.144MHz, 6.176MHz, 6.312MHz, 6.400MHz, 8.000MHz, 8.192MHz, 8.448MHz, 10.000MHz, 12.000MHz,
12.288MHz, 12.352MHz, 12.960MHz, 13.000MHz, 13.500MHz, 14.318MHz, 15.360MHz, 15.440MHz, 16.000MHz, 16.384MHz,
16.660MHz, 17.664MHz, 18.432MHz, 19.200MHz, 19.440MHz, 20.000MHz, 20.480MHz, 24.000MHz, 24.576MHz, 24.704MHz, 25.000MHz, 25.920MHz,
26.000MHz, 27.000MHz, 28.636MHz, 30.000MHz, 30.720MHz, 32.000MHz, 32.768MHz, 34.368MHz, 35.328MHz, 36.864MHz,
38.880MHz, 40.000MHz, 40.960MHz, 44.736MHz, 49.152MHz, 50.000MHz, 51.840MHz, 52.000MHz, 62.208MHz, 65.536MHz, 74.250MHz,
or 77.760MHz |
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The specified reference or "center" frequency of the oscillator.
Typically specified in megahertz (MHz)or kilohertz (kHz).
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Frequency Tolerance/Stability |
±50ppm Maximum (Inclusive of all conditions: Calibration Tolerance at 25°C,
Frequency Stability over the Operating Temperature Range, Supply Voltage Change, Output
Load Change, Shock, and Vibration) |
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This "inclusive" specification is the amount of frequency deviation
from the center frequency associated with a set of operating
conditions. These conditions include: Operating Temperature Range,
Supply Voltage, and Output Load. This parameter is specified with a
maximum and minimum frequency deviation, expressed in percent (%)
or parts per million (ppm).
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Operating Temperature Range (OTR) |
0°C to +70°C (Standard)
-40°C to +85°C (Optional) |
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The maximum and minimum temperatures that
the oscillator device can be exposed to during oscillation. Over this
temperature range, all of the specified device operating
parameters are guaranteed.
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Supply Voltage (VDD) |
2.5VDC ±5% |
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The DC input voltage necessary for oscillator operation, specified in
volts.
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Input Current (IDD) |
15mA Maximum |
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The amount of current consumption by an oscillator from the power
supply, typically specified in milliamps (mA).
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Output Voltage Logic High (VOH) |
90% of VDD Minimum (IOH = -4mA) |
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Defined as the Output Voltage Logic High or "Logic 1"
(Figure 1 in oscillator
glossary of terms).
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Output Voltage Logic Low (VOL) |
10% of VDD Maximum (IOL = +4mA) |
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Defined as the Output Voltage Logic Low or "Logic 0"
(Figure 1 in oscillator
glossary of terms).
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Duty Cycle (SYM) |
Measured at 50% of waveform.
50 ±10(%) (Maximum)
50 ±5(%) (Typical) |
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The measure of output waveform uniformity. This term, also referred
to as symmetry, is a measurement of the time that the output
waveform is in a logic high state, expressed as a percentage (%).
This parameter is measured at a specified voltage threshold or at a
percentage of the output waveform amplitude (Figure 1 in the oscillator glossary of terms).
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Rise Time/Fall Time (TR/TF) |
5nSec Maximum Measured over 20% to 80% of waveform. |
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The Rise Time, measured in nanoseconds (nSec), is defined as the
transition time from an output logic low to an output logic high.
Conversely, the Fall Time, also measured in nanoseconds (nSec), is
defined as the transition time from an output logic high to an output
logic low. This transition time is measured at specified voltage
thresholds or at specified percentages of the output waveform
amplitude
(Figure 1 in the oscillator glossary of terms).
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Load Drive Capability |
15pF Maximum |
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The maximum load the oscillator can drive specified in terms of the
number of gates or the type of load circuit (Figures 2, 3 and 4 in oscillator glossary of terms).
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| Output Logic Type |
CMOS
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Aging (at 25°C) |
±2ppm/1st year Typical
±10ppm/10 years Maximum |
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The systematic change in frequency with time due to internal changes in the crystal. Aging
is often expressed as a maximum value in parts per million per year (ppm/yr). The rate of
aging is typically greatest during the first 30 to 60 days after which time the aging rate
decreases. The following factors effect crystal aging: adsorption and desorption of
contamination on the surfaces of the quartz, stress relief of the mounting and bonding
structures, material outgassing, and seal integrity.
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Storage Temperature Range (STR) |
-55°C to +125°C |
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The minimum and maximum temperatures that the device can
be stored or exposed to when in a non-oscillation state. After exposing or
storing the device at the minimum or maximum temperatures for a length of
time, all of the operating specifications are guaranteed over the specified
Operating Temperature Range.
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Start Up Time (TS) |
10mSec Maximum |
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The specified time from oscillator power-up to the time the oscillator
reaches steady state oscillation.
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| Absolute Pull Range (APR) |
Inclusive of all conditions: Calibration Tolerance at 25°C, Frequency Stability
over the Operating Temperature Range, Supply Voltage Change, Output Load Change,
Shock, Vibration, and Aging over Control Voltage (VC)
±50ppm Minimum
±80ppm Minimum (Only available over Nominal Frequency range of 1.544MHz to 51.84MHz)
±100ppm Minimum (Only available over Nominal Frequency range of 1.544MHz to 36MHz)
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| Control Voltage |
Test Condition for APR
0.2VDC to 2.3VDC
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| Control Voltage Range |
Test Condition for APR
0.0VDC to VDD
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| Linearity |
20% Maximum
10% Typical
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| Transfer function |
Positive Transfer Characteristic |
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| Modulation Bandwidth (MBW) |
10kHz Minimum measured at -3dB with a control voltage of 1.25VDC |
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| Input Impedance (ZI) |
50kOhms Minimum |
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| Input Leakage Current |
10µA Maximum |
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| Typical Phase Noise |
(Measured at FO of 27.000MHz)
-65dBc/Hz at offset of 10Hz
-95dBc/Hz at offset of 100Hz
-120dBc/Hz at offset of 1kHz
-142dBc/Hz at offset of 10kHz
-152dBc/Hz at offset of 100kHz
-154dBc/Hz at offset of 1MHz
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| Tri-State Input Voltage |
No Connection Enables Output
+0.9VDD Minimum Enables Output
+0.1VDD Disables Output: High Impedance
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| RMS Phase Jitter |
FJ=12kHz to 20MHz
1pSec Maximum |
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| All Dimensions in Millimeters |
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| Pin 1: Control Voltage (VC) |
Pin 3: Case Ground |
Pin 5: Tri-State |
| Pin 2: No Connect |
Pin 4: Output |
Pin 6: Supply Voltage |
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| Please note that this form is intended to provide a listing
of standard options. If you require an option or configuration
that is not present here, you may want to fill out our
Custom Oscillator Part Number Request Form. If you have any trouble with
this form, or just have a suggestion as to how it might be improved, please
contact our Global Customer Support Team. |
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| Line 1: |
ECLIPTEK |
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| Line 2: |
XX.XXXM
- XX.XXX = Frequency (5 Digits Maximum + Decimal)
- M = Frequency unit of measure(MHz)
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| Line 3: |
XXYZZ
- XX = Ecliptek Manufacturing Identifier
- Y = Last digit of Year
- ZZ = Week of Year
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| ESD Susceptibility: |
MIL-STD-883, Method 3015, Class 2, HBM: 1500V |
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| Fine Leak Test: |
MIL-STD-883, Method 1014, Condition A |
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| Flammability: |
UL94-V0 |
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| Gross Leak Test: |
MIL-STD-883, Method 1014, Condition C |
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| Mechanical Shock: |
MIL-STD-883, Method 2002, Condition B |
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| Moisture Resistance: |
MIL-STD-883, Method 1004 |
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| Moisture Sensitivity: |
J-STD-020, MSL 1 |
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| Resistance to Soldering Heat: |
MIL-STD-202, Method 210, Condition K |
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| Resistance to Solvents: |
MIL-STD-202, Method 215 |
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| Solderability: |
MIL-STD-883, Method 2003 |
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| Temperature Cycling: |
MIL-STD-883, Method 1010, Condition B |
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| Vibration: |
MIL-STD-883, Method 2007, Condition A |
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Mechanical Dimensions
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